SURFACE SPECTROSCOPIES

SURFACE SPECTROSCOPIES

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iten
Codice
94837
ANNO ACCADEMICO
2018/2019
CFU
3 cfu al 2° anno di 9017 SCIENZA E INGEGNERIA DEI MATERIALI (LM-53) GENOVA
SETTORE SCIENTIFICO DISCIPLINARE
FIS/03
LINGUA
Inglese
SEDE
GENOVA (SCIENZA E INGEGNERIA DEI MATERIALI )
periodo
1° Semestre
moduli
Questo insegnamento è un modulo di:
materiale didattico

PRESENTAZIONE

OBIETTIVI E CONTENUTI

OBIETTIVI FORMATIVI

Acquire the basic knowledge of X-ray powder diffraction techniques, through practical activities aimed at interpreting diffraction data. Knowledge of the instrumentation and operational techniques for compositional and structural analyses.

PROGRAMMA/CONTENUTO

Powder diffraction techniques. Interpretation of diffraction data from polycrystalline samples: phase identification, indexing methods, structure  refinement by the Rietveld method. Introduction to surface sensitive techniques based on electron and photon beams. The Ultra High Vacuum Environment. Low energy electron diffraction (LEED) and grazing angle X-ray diffraction (GISAX). X-Ray photoemission spectroscopy (XPS). Auger electron spectroscopy (AES). Fluorescence. Photoelectron diffraction. EXAFS and NEXAFS. Synchrotron radiation and its sources.

TESTI/BIBLIOGRAFIA

V. K. Pecharsky, P. Y. Zavalij “Fundamentals of powder diffraction and structural  characterization of materials” Kluwer Academic Press International Tables of Crystallography Vols.1-4

DOCENTI E COMMISSIONI

Commissione d'esame

LETIZIA SAVIO (Presidente)

MARCELLA PANI (Presidente)