ADVANCED MICROSCOPY

ADVANCED MICROSCOPY

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iten
Code
94830
ACADEMIC YEAR
2018/2019
CREDITS
3 credits during the 1st year of 9017 Materials Science and Engineering (LM-53) GENOVA
SCIENTIFIC DISCIPLINARY SECTOR
CHIM/03
LANGUAGE
English
TEACHING LOCATION
GENOVA (Materials Science and Engineering)
semester
2° Semester
Teaching materials

OVERVIEW

Understanding the fundamentals of microscopy techniques and interrelated spectroscopies  in the investigation of  materials.

AIMS AND CONTENT

LEARNING OUTCOMES

Understanding the fundamentals of electron microscopies and energy dispersive x-ray spectroscopy, which permit the observation and characterization of heterogeneous organic and inorganic materials.

Teaching methods

Lectures + lab sessions

SYLLABUS/CONTENT

Scanning electron microscopy and microprobe: electron optics, electron beam - specimen interaction, signal detection, image formation, contrast types. EDX and WDX spectroscopy; qualitative and quantitative x-ray analysis.

Transmission electron microscopy: elastic and inelastic scattering phenomena. The microscope: the illumination system, the objective lens and stage, the imaging system. Introduction to the different types of contrast. Introduction to electron diffraction. Sample preparation techniques.

RECOMMENDED READING/BIBLIOGRAPHY

“Scanning Electron Microscopy and X-ray Microanalysis”, J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, A.D. Romig, Jr., C.E. Lyman, C. Fiori, E. Lifshin, Plenum Press, 1992.

“Trasmission Electron Microscopy”, D.B. Williams and C.B. Carter, Plenum Press, 1996.

TEACHERS AND EXAM BOARD

Ricevimento: every day by appointment

Exam Board

PAOLA RIANI (President)

ANDREA BASSO

LESSONS

Teaching methods

Lectures + lab sessions

LESSONS START

Second semester

EXAMS

Exam description

Written exam lasting 2 hours with open questions.

Assessment methods

Student have to answer to some questions on the topics covered in the course.

Five questions will be proposed: 3 on SEM and 2 on TEM.

The student must answer 2 of the 3 questions on the SEM and 1 of the 2 questions on the TEM.